# Automated Void Detection in TSVs from 2D X-Ray Scans using Supervised Learning with 3D X-Ray Scans

> Research article (2021 IEEE 71st Electronic Components and Technology Conference (ECTC), 2021) · cited 11× · AI/ML

**Wikidata**: [openalex:W3188464007](https://www.wikidata.org/wiki/openalex:W3188464007)  
**Source**: https://4ort.xyz/entity/automated-void-detection-in-tsvs-from-2d-x-ray-scans-using-supervised-learning-with-3d-x-ray-scans