# Automated Optical Inspection Using Anomaly Detection and Unsupervised Defect Clustering

> Research article (2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020) · cited 11× · AI/ML

**Wikidata**: [openalex:W3092212698](https://www.wikidata.org/wiki/openalex:W3092212698)  
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