# Automated Inclusion Microanalysis in Steel by Computer-Based Scanning Electron Microscopy: Accelerating Voltage, Backscattered Electron Image Quality, and Analysis Time

> Research article (Microscopy and Microanalysis, 2017) · cited 37× · AI/ML

**Wikidata**: [openalex:W2767639821](https://www.wikidata.org/wiki/openalex:W2767639821)  
**Source**: https://4ort.xyz/entity/automated-inclusion-microanalysis-in-steel-by-computer-based-scanning-electron-microscopy-accelerating-voltage-backscatt