# Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain

> Research article (2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 2020) · cited 16× · AI/ML

**Wikidata**: [openalex:W3126753018](https://www.wikidata.org/wiki/openalex:W3126753018)  
**Source**: https://4ort.xyz/entity/automated-detection-and-localization-of-counterfeit-chip-defects-by-texture-analysis-in-infrared-ir-domain