# Automated Defect Inspection in Reverse Engineering of Integrated Circuits

> Research article (2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 2022) · cited 14× · AI/ML

**Wikidata**: [openalex:W4212795644](https://www.wikidata.org/wiki/openalex:W4212795644)  
**Source**: https://4ort.xyz/entity/automated-defect-inspection-in-reverse-engineering-of-integrated-circuits