# Automated defect identification from carrier fringe patterns using Wigner–Ville distribution and a machine learning-based method

> Research article (Applied Optics, 2021) · cited 18× · AI/ML

**Wikidata**: [openalex:W3162650107](https://www.wikidata.org/wiki/openalex:W3162650107)  
**Source**: https://4ort.xyz/entity/automated-defect-identification-from-carrier-fringe-patterns-using-wignerville-distribution-and-a-machine-learning-based