# Automated defect detection of insulated gate bipolar transistor based on computed laminography imaging

> Research article (Microelectronics Reliability, 2020) · cited 10× · AI/ML

**Wikidata**: [openalex:W3094508924](https://www.wikidata.org/wiki/openalex:W3094508924)  
**Source**: https://4ort.xyz/entity/automated-defect-detection-of-insulated-gate-bipolar-transistor-based-on-computed-laminography-imaging