# Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips

> Research article (Journal of Intelligent Manufacturing, 2016) · cited 20× · AI/ML

**Wikidata**: [openalex:W2556383233](https://www.wikidata.org/wiki/openalex:W2556383233)  
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