# Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices

> Research article (Microelectronics Reliability, 2016) · cited 11× · AI/ML

**Wikidata**: [openalex:W2518944711](https://www.wikidata.org/wiki/openalex:W2518944711)  
**Source**: https://4ort.xyz/entity/application-of-the-defect-clustering-model-for-forming-set-and-reset-statistics-in-rram-devices