# Application of Noise to Avoid Overfitting in TCAD Augmented Machine Learning

> Research article (2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2020) · cited 30× · AI/ML

**Wikidata**: [openalex:W3095031844](https://www.wikidata.org/wiki/openalex:W3095031844)  
**Source**: https://4ort.xyz/entity/application-of-noise-to-avoid-overfitting-in-tcad-augmented-machine-learning