# Analyzing Surface Defects in Apples Using Gabor Features

> Research article (2016 12th International Conference on Signal-Image Technology & Internet-Based Systems (SITIS), 2016) · cited 16× · AI/ML

**Wikidata**: [openalex:W2609668474](https://www.wikidata.org/wiki/openalex:W2609668474)  
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