# Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learning Model

> Research article (2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2020) · cited 16× · AI/ML

**Wikidata**: [openalex:W3036162342](https://www.wikidata.org/wiki/openalex:W3036162342)  
**Source**: https://4ort.xyz/entity/analysis-on-process-variation-effect-of-3d-nand-flash-memory-cell-through-machine-learning-model