# Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects

> Research article (IEEE Transactions on Nuclear Science, 2016) · cited 45× · AI/ML

**Wikidata**: [openalex:W2342824154](https://www.wikidata.org/wiki/openalex:W2342824154)  
**Source**: https://4ort.xyz/entity/analysis-of-sram-based-fpga-seu-sensitivity-to-combined-emi-and-tid-imprinted-effects