# Analysis of origin of measured 1/ f noise in high-power semiconductor laser diodes far below threshold current

> Research article (Microelectronics Reliability, 2015) · cited 13× · AI/ML

**Wikidata**: [openalex:W2216916820](https://www.wikidata.org/wiki/openalex:W2216916820)  
**Source**: https://4ort.xyz/entity/analysis-of-origin-of-measured-1-f-noise-in-high-power-semiconductor-laser-diodes-far-below-threshold-current