# An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis

> Research article (Reliability Engineering & System Safety, 2024) · cited 62× · AI/ML

**Wikidata**: [openalex:W4391288556](https://www.wikidata.org/wiki/openalex:W4391288556)  
**Source**: https://4ort.xyz/entity/an-unknown-wafer-surface-defect-detection-approach-based-on-incremental-learning-for-reliability-analysis