# An oversampling method for wafer map defect pattern classification considering small and imbalanced data

> Research article (Computers & Industrial Engineering, 2021) · cited 28× · AI/ML

**Wikidata**: [openalex:W3208761568](https://www.wikidata.org/wiki/openalex:W3208761568)  
**Source**: https://4ort.xyz/entity/an-oversampling-method-for-wafer-map-defect-pattern-classification-considering-small-and-imbalanced-data