# An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner

> Research article (Sensors, 2019) · cited 46× · AI/ML

**Wikidata**: [openalex:W2965333634](https://www.wikidata.org/wiki/openalex:W2965333634)  
**Source**: https://4ort.xyz/entity/an-improved-low-noise-processing-methodology-combined-with-pcl-for-industry-inspection-based-on-laser-line-scanner