# An improved image processing algorithm for automatic defect inspection in TFT-LCD TCON

> Research article (Nonlinear Engineering, 2021) · cited 71× · AI/ML

**Wikidata**: [openalex:W3206374948](https://www.wikidata.org/wiki/openalex:W3206374948)  
**Source**: https://4ort.xyz/entity/an-improved-image-processing-algorithm-for-automatic-defect-inspection-in-tft-lcd-tcon