# An Improved Capsule Network (WaferCaps) for Wafer Bin Map Classification Based on DCGAN Data Upsampling

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2021) · cited 32× · AI/ML

**Wikidata**: [openalex:W4205157413](https://www.wikidata.org/wiki/openalex:W4205157413)  
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