# An Expert System for Testing of Microcontroller Systems Designers

> Research article (2020 IEEE International Conference on Problems of Infocommunications. Science and Technology (PIC S&T), 2020) · cited 14× · AI/ML

**Wikidata**: [openalex:W3182619368](https://www.wikidata.org/wiki/openalex:W3182619368)  
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