# An ensemble-based deep semi-supervised learning for the classification of Wafer Bin Maps defect patterns

> Research article (Computers & Industrial Engineering, 2022) · cited 29× · AI/ML

**Wikidata**: [openalex:W4293581782](https://www.wikidata.org/wiki/openalex:W4293581782)  
**Source**: https://4ort.xyz/entity/an-ensemble-based-deep-semi-supervised-learning-for-the-classification-of-wafer-bin-maps-defect-patterns