# An Auto Chip Package Surface Defect Detection Based on Deep Learning

> Research article (IEEE Transactions on Instrumentation and Measurement, 2023) · cited 28× · AI/ML

**Wikidata**: [openalex:W4390357076](https://www.wikidata.org/wiki/openalex:W4390357076)  
**Source**: https://4ort.xyz/entity/an-auto-chip-package-surface-defect-detection-based-on-deep-learning