# An Attention-Augmented Convolutional Neural Network With Focal Loss for Mixed-Type Wafer Defect Classification

> Research article (IEEE Access, 2023) · cited 13× · AI/ML

**Wikidata**: [openalex:W4387247620](https://www.wikidata.org/wiki/openalex:W4387247620)  
**Source**: https://4ort.xyz/entity/an-attention-augmented-convolutional-neural-network-with-focal-loss-for-mixed-type-wafer-defect-classification