# An Artificial Neural Network Model for Electro-Thermal Effect Affected Hot Carrier Injection Reliability in 14-nm FinFETs

> Research article (IEEE Transactions on Microwave Theory and Techniques, 2022) · cited 14× · AI/ML

**Wikidata**: [openalex:W4285291154](https://www.wikidata.org/wiki/openalex:W4285291154)  
**Source**: https://4ort.xyz/entity/an-artificial-neural-network-model-for-electro-thermal-effect-affected-hot-carrier-injection-reliability-in-14-nm-finfet