# An artificial neural network approach for wafer dicing saw quality prediction

> Research article (Microelectronics Reliability, 2018) · cited 32× · AI/ML

**Wikidata**: [openalex:W2898100381](https://www.wikidata.org/wiki/openalex:W2898100381)  
**Source**: https://4ort.xyz/entity/an-artificial-neural-network-approach-for-wafer-dicing-saw-quality-prediction