# An Analytical Model to Estimate FinFET's V<sub>T</sub>Distribution Due to Fin-Edge Roughness

> Research article (IEEE Transactions on Electron Devices, 2016) · cited 17× · AI/ML

**Wikidata**: [openalex:W2285780107](https://www.wikidata.org/wiki/openalex:W2285780107)  
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