# All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis

> Research article (2022 IEEE 40th VLSI Test Symposium (VTS), 2022) · cited 14× · AI/ML

**Wikidata**: [openalex:W4282972846](https://www.wikidata.org/wiki/openalex:W4282972846)  
**Source**: https://4ort.xyz/entity/all-digital-low-overhead-sar-adc-built-in-self-test-for-fault-detection-and-diagnosis