# Algorithmic Scheme for Concurrent Detection and Classification of Printed Circuit Board Defects

> Research article (Computers, materials & continua/Computers, materials & continua (Print), 2021) · cited 27× · AI/ML

**Wikidata**: [openalex:W3209172097](https://www.wikidata.org/wiki/openalex:W3209172097)  
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