# AI classification of wafer map defect patterns by using dual-channel convolutional neural network

> Research article (Engineering Failure Analysis, 2021) · cited 39× · AI/ML

**Wikidata**: [openalex:W3201304935](https://www.wikidata.org/wiki/openalex:W3201304935)  
**Source**: https://4ort.xyz/entity/ai-classification-of-wafer-map-defect-patterns-by-using-dual-channel-convolutional-neural-network