# Aging model challenges in deeply scaled tri-gate technologies

> Research article (2015 IEEE International Integrated Reliability Workshop (IIRW), 2015) · cited 17× · AI/ML

**Wikidata**: [openalex:W2540962972](https://www.wikidata.org/wiki/openalex:W2540962972)  
**Source**: https://4ort.xyz/entity/aging-model-challenges-in-deeply-scaled-tri-gate-technologies