# Advanced Anomaly Detection in Manufacturing Processes: Leveraging Feature Value Analysis for Normalizing Anomalous Data

> Research article (Electronics, 2024) · cited 10× · AI/ML

**Wikidata**: [openalex:W4393993714](https://www.wikidata.org/wiki/openalex:W4393993714)  
**Source**: https://4ort.xyz/entity/advanced-anomaly-detection-in-manufacturing-processes-leveraging-feature-value-analysis-for-normalizing-anomalous-data