# Accurate Picture of Cycling Degradation in HfO<sub>2</sub>-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis

> Research article (2021 IEEE International Electron Devices Meeting (IEDM), 2021) · cited 37× · AI/ML

**Wikidata**: [openalex:W4225495011](https://www.wikidata.org/wiki/openalex:W4225495011)  
**Source**: https://4ort.xyz/entity/accurate-picture-of-cycling-degradation-in-hfo-sub-2-sub-fefet-based-on-charge-trapping-dynamics-revealed-by-fast-charge