# Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric

> Research article (Ultramicroscopy, 2017) · cited 13× · AI/ML

**Wikidata**: [openalex:W2612863735](https://www.wikidata.org/wiki/openalex:W2612863735)  
**Source**: https://4ort.xyz/entity/accuracy-and-precision-of-thickness-determination-from-position-averaged-convergent-beam-electron-diffraction-patterns-u