# A Wafer Map Defect Pattern Classification Model Based on Deep Convolutional Neural Network

> Research article (2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT), 2020) · cited 10× · AI/ML

**Wikidata**: [openalex:W3117904724](https://www.wikidata.org/wiki/openalex:W3117904724)  
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