# A voting-based ensemble feature network for semiconductor wafer defect classification

> Research article (Scientific Reports, 2022) · cited 26× · AI/ML

**Wikidata**: [openalex:W4297502257](https://www.wikidata.org/wiki/openalex:W4297502257)  
**Source**: https://4ort.xyz/entity/a-voting-based-ensemble-feature-network-for-semiconductor-wafer-defect-classification