# A Variational Autoencoder Enhanced Deep Learning Model for Wafer Defect Imbalanced Classification

> Research article (IEEE Transactions on Components Packaging and Manufacturing Technology, 2021) · cited 42× · AI/ML

**Wikidata**: [openalex:W3212904554](https://www.wikidata.org/wiki/openalex:W3212904554)  
**Source**: https://4ort.xyz/entity/a-variational-autoencoder-enhanced-deep-learning-model-for-wafer-defect-imbalanced-classification