# A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions

> Research article (Expert Systems with Applications, 2021) · cited 18× · AI/ML

**Wikidata**: [openalex:W3176666531](https://www.wikidata.org/wiki/openalex:W3176666531)  
**Source**: https://4ort.xyz/entity/a-system-for-identifying-an-anti-counterfeiting-pattern-based-on-the-statistical-difference-in-key-image-regions