# A Semi-Supervised and Incremental Modeling Framework for Wafer Map Classification

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2020) · cited 69× · AI/ML

**Wikidata**: [openalex:W3000664697](https://www.wikidata.org/wiki/openalex:W3000664697)  
**Source**: https://4ort.xyz/entity/a-semi-supervised-and-incremental-modeling-framework-for-wafer-map-classification