# A self-adaptive DBSCAN-based method for wafer bin map defect pattern classification

> Research article (Microelectronics Reliability, 2021) · cited 10× · AI/ML

**Wikidata**: [openalex:W3169045948](https://www.wikidata.org/wiki/openalex:W3169045948)  
**Source**: https://4ort.xyz/entity/a-self-adaptive-dbscan-based-method-for-wafer-bin-map-defect-pattern-classification