# A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty

> Research article (IET Power Electronics, 2023) · cited 14× · AI/ML

**Wikidata**: [openalex:W4388851080](https://www.wikidata.org/wiki/openalex:W4388851080)  
**Source**: https://4ort.xyz/entity/a-remaining-useful-life-prediction-method-of-sic-mosfet-considering-failure-threshold-uncertainty