# A Regularized Singular Value Decomposition-Based Approach for Failure Pattern Classification on Fail Bit Map in a DRAM Wafer

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2015) · cited 35× · AI/ML

**Wikidata**: [openalex:W2042065072](https://www.wikidata.org/wiki/openalex:W2042065072)  
**Source**: https://4ort.xyz/entity/a-regularized-singular-value-decomposition-based-approach-for-failure-pattern-classification-on-fail-bit-map-in-a-dram-w