# A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter

> Research article (Microelectronics Reliability, 2018) · cited 36× · AI/ML

**Wikidata**: [openalex:W2895027899](https://www.wikidata.org/wiki/openalex:W2895027899)  
**Source**: https://4ort.xyz/entity/a-prognostic-methodology-for-power-mosfets-under-thermal-stress-using-echo-state-network-and-particle-filter