# A Parametrical Model for Instance-Dependent Label Noise

> Research article (IEEE Transactions on Pattern Analysis and Machine Intelligence, 2023) · cited 12× · AI/ML

**Wikidata**: [openalex:W4385574960](https://www.wikidata.org/wiki/openalex:W4385574960)  
**Source**: https://4ort.xyz/entity/a-parametrical-model-for-instance-dependent-label-noise