# A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction

> Research article (IEEE Transactions on Instrumentation and Measurement, 2020) · cited 30× · AI/ML

**Wikidata**: [openalex:W3102544523](https://www.wikidata.org/wiki/openalex:W3102544523)  
**Source**: https://4ort.xyz/entity/a-novel-pixel-wise-defect-inspection-method-based-on-stable-background-reconstruction