# A novel method to design and evaluate artificial neural network for thin film thickness measurement traceable to the length standard

> Research article (Scientific Reports, 2022) · cited 12× · AI/ML

**Wikidata**: [openalex:W4210908297](https://www.wikidata.org/wiki/openalex:W4210908297)  
**Source**: https://4ort.xyz/entity/a-novel-method-to-design-and-evaluate-artificial-neural-network-for-thin-film-thickness-measurement-traceable-to-the-len