# A novel hypergraph convolution network for wafer defect patterns identification based on an unbalanced dataset

> Research article (Journal of Intelligent Manufacturing, 2022) · cited 19× · AI/ML

**Wikidata**: [openalex:W4311808227](https://www.wikidata.org/wiki/openalex:W4311808227)  
**Source**: https://4ort.xyz/entity/a-novel-hypergraph-convolution-network-for-wafer-defect-patterns-identification-based-on-an-unbalanced-dataset