# A Novel Convolution Neural Network Model for Wafer Map Defect Patterns Classification

> Research article (2022 IEEE Region 10 Symposium (TENSYMP), 2022) · cited 11× · AI/ML

**Wikidata**: [openalex:W4293868792](https://www.wikidata.org/wiki/openalex:W4293868792)  
**Source**: https://4ort.xyz/entity/a-novel-convolution-neural-network-model-for-wafer-map-defect-patterns-classification