# A new ViT-Based augmentation framework for wafer map defect classification to enhance the resilience of semiconductor supply chains

> Research article (International Journal of Production Economics, 2024) · cited 25× · AI/ML

**Wikidata**: [openalex:W4396907591](https://www.wikidata.org/wiki/openalex:W4396907591)  
**Source**: https://4ort.xyz/entity/a-new-vit-based-augmentation-framework-for-wafer-map-defect-classification-to-enhance-the-resilience-of-semiconductor-su