# A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction

> Research article (Sensors, 2020) · cited 17× · AI/ML

**Wikidata**: [openalex:W3000337104](https://www.wikidata.org/wiki/openalex:W3000337104)  
**Source**: https://4ort.xyz/entity/a-new-stitching-method-for-dark-field-surface-defects-inspection-based-on-simplified-target-tracking-and-path-correction