# A New Process Industry Fault Diagnosis Algorithm Based on Ensemble Improved Binary‐Tree SVM

> Research article (Chinese Journal of Electronics, 2015) · cited 17× · AI/ML

**Wikidata**: [openalex:W2305225441](https://www.wikidata.org/wiki/openalex:W2305225441)  
**Source**: https://4ort.xyz/entity/a-new-process-industry-fault-diagnosis-algorithm-based-on-ensemble-improved-binarytree-svm